MT3: Meta Test-Time Training for Self-Supervised Test-Time Adaption
Alexander Bartler, Andre Bühler, Felix Wiewel, Mario Döbler, Bin Yang
Abstract
An unresolved problem in Deep Learning is the ability of neural networks to cope with domain shifts during test-time, imposed by commonly fixing network parameters after training. Our proposed method Meta Test-Time Training (MT3), however, breaks this paradigm and enables adaption at test-time. We combine meta-learning, self-supervision and test-time training to learn to adapt to unseen test distributions. By minimizing the self-supervised loss, we learn task-specific model parameters for different tasks. A meta-model is optimized such that its adaption to the different task-specific models leads to higher performance on those tasks. During test-time a single unlabeled image is sufficient to adapt the meta-model parameters. This is achieved by minimizing only the self-supervised loss component resulting in a better prediction for that image. Our approach significantly improves the state-of-the-art results on the CIFAR-10-Corrupted image classification benchmark.
BibTeX
@InProceedings{pmlr-v151-bartler22a,
title = { MT3: Meta Test-Time Training for Self-Supervised Test-Time Adaption },
author = {Bartler, Alexander and B\"uhler, Andre and Wiewel, Felix and D\"obler, Mario and Yang, Bin},
booktitle = {Proceedings of The 25th International Conference on Artificial Intelligence and Statistics},
pages = {3080--3090},
year = {2022},
editor = {Camps-Valls, Gustau and Ruiz, Francisco J. R. and Valera, Isabel},
volume = {151},
series = {Proceedings of Machine Learning Research},
month = {28--30 Mar},
publisher = {PMLR},
pdf = {https://proceedings.mlr.press/v151/bartler22a/bartler22a.pdf},
url = {https://proceedings.mlr.press/v151/bartler22a.html},
abstract = { An unresolved problem in Deep Learning is the ability of neural networks to cope with domain shifts during test-time, imposed by commonly fixing network parameters after training. Our proposed method Meta Test-Time Training (MT3), however, breaks this paradigm and enables adaption at test-time. We combine meta-learning, self-supervision and test-time training to learn to adapt to unseen test distributions. By minimizing the self-supervised loss, we learn task-specific model parameters for different tasks. A meta-model is optimized such that its adaption to the different task-specific models leads to higher performance on those tasks. During test-time a single unlabeled image is sufficient to adapt the meta-model parameters. This is achieved by minimizing only the self-supervised loss component resulting in a better prediction for that image. Our approach significantly improves the state-of-the-art results on the CIFAR-10-Corrupted image classification benchmark. }
}