Material Classification Using Raw Time-Of-Flight Measurements

Shuochen Su; Felix Heide; Robin Swanson; Jonathan Klein; Clara Callenberg; Matthias Hullin; Wolfgang Heidrich

CVPR 2016poster72 citations

Material Classification Using Raw Time-Of-Flight Measurements

Shuochen Su, Felix Heide, Robin Swanson, Jonathan Klein, Clara Callenberg, Matthias Hullin, Wolfgang Heidrich

Abstract

We propose a material classification method using raw time-of-flight (ToF) measurements. ToF cameras capture the correlation between a reference signal and the temporal response of material to incident illumination. Such measurements encode unique signatures of the material, i.e. the degree of subsurface scattering inside a volume. Subsequently, it offers an orthogonal domain of feature representation compared to conventional spatial and angular reflectance-based approaches. We demonstrate the effectiveness, robustness, and efficiency of our method through experiments and comparisons of real-world materials.

BibTeX

@inproceedings{cvpr2016_materialclassifi,
  title = {Material Classification Using Raw Time-Of-Flight Measurements},
  author = {Shuochen Su and Felix Heide and Robin Swanson and Jonathan Klein and Clara Callenberg and Matthias Hullin and Wolfgang Heidrich},
  booktitle = {CVPR 2016},
  year = {2016}
}