CVPR 2025poster0 citations

Potential Field Based Deep Metric Learning

Shubhang Bhatnagar, Narendra Ahuja

Abstract

Deep metric learning (DML) involves training a network to learn a semantically meaningful representation space. Many current approaches mine n-tuples of examples and model interactions within each tuplets. We present a novel, compositional DML model that instead of in tuples, represents the influence of each example (embedding) by a continuous potential field, and superposes the fields to obtain their combined global potential field. We use attractive/repulsive potential fields to represent interactions among embeddings from images of the same/different classes. Contrary to typical learning methods, where mutual influence of samples is proportional to their distance, we enforce reduction in such influence with distance, leading to a decaying field. We show that such decay helps improve performance on real world datasets with large intra-class variations and label noise. Like other proxy-based methods, we also use proxies to succinctly represent sub-populations of examples. We evaluate our method on three standard DML benchmarks- Cars-196, CUB-200-2011, and SOP datasets where it outperforms state-of-the-art baselines.

BibTeX
@InProceedings{Bhatnagar_2025_CVPR,
    author    = {Bhatnagar, Shubhang and Ahuja, Narendra},
    title     = {Potential Field Based Deep Metric Learning},
    booktitle = {Proceedings of the Computer Vision and Pattern Recognition Conference (CVPR)},
    month     = {June},
    year      = {2025},
    pages     = {25549-25559}
}