Towards Optimized Multi-Channel Modulo-ADCs: Moduli Selection Strategies and Bit Depth Analysis
Wenyi Yan, Lu Gan, Shaoqing Hu, Hongqing Liu
Abstract
This paper presents a theoretical analysis of multi-channel modulo analog-to-digital converters (ADCs) for high-dynamic range sampling under bounded noise. In particular, we derive the maximum error tolerance in terms of ADC dynamic range, signal dynamic range, and channel number. Additionally, we present closed-form expressions for ADC thresholds, ensuring near-optimal error resilience, and analyzing the minimal bit-depth needed for stable recovery. Compared to single-channel modulo ADCs, our approach achieves superior error tolerance with reduced sampling rates. Moreover, it demands a minor bit rate increase compared to conventional ADCs but operates with a significantly smaller ADC dynamic range.
BibTeX
@inproceedings{icassp2024_towardsoptimized,
title = {Towards Optimized Multi-Channel Modulo-ADCs: Moduli Selection Strategies and Bit Depth Analysis},
author = {Wenyi Yan and Lu Gan and Shaoqing Hu and Hongqing Liu},
booktitle = {ICASSP 2024},
year = {2024}
}