DuPI: Dual-resolution Pseudo-label Integration for Semi-supervised Instance Segmentation

Abstract

The role of high-quality pseudo-labels is pivotal in semi-supervised instance segmentation (SSIS). However, existing SSIS frameworks predominantly produce pseudo-labels at a single resolution, which can introduce noise that adversely affects the quality of learning at both the pixel level and in terms of class discrimination. This paper introduces the Dual-Resolution Pseudo-Label Integration for Semi-Supervised Instance Segmentation (DuPI), a novel framework designed to enhance learning by integrating pseudo-labels derived from dual-resolution inputs. The DuPI framework incorporates a Dual-Resolution Pseudo-Label Correction (DPC) module, which refines pseudo-labels through a process of cross-resolution rectification and fusion. Furthermore, the framework introduces an Area-Adaptive Learning (AAL) strategy aimed at enhancing the quality of pseudo-labels sourced from extra-resolution inputs. The AAL strategy addresses the training challenges associated with small objects at lower resolutions by re-weighting pseudo-labels corresponding to tiny mask areas using Intersection over Union (IoU) metrics from the assignments. Experiments on the COCO and BDD100K datasets demonstrate that DuPI achieves state-of-the-art SSIS performance under various semi-supervised settings.