Reflectance Capture Using Univariate Sampling of BRDFs
Zhuo Hui, Kalyan Sunkavalli, Joon-Young Lee, Sunil Hadap, Jian Wang, Aswin C. Sankaranarayanan
Abstract
We propose the use of a light-weight setup consisting of a collocated camera and light source --- commonly found on mobile devices --- to reconstruct surface normals and spatially-varying BRDFs of near-planar material samples. A collocated setup provides only a 1-D "univariate" sampling of the 4-D BRDF. We show that a univariate sampling is sufficient to estimate parameters of commonly used analytical BRDF models. Subsequently, we use a dictionary-based reflectance prior to derive a robust technique for per-pixel normal and BRDF estimation. We demonstrate real-world shape and capture, and its application to material editing and classification, using real data acquired using a mobile phone.
BibTeX
@inproceedings{iccv2017_reflectancecaptu,
title = {Reflectance Capture Using Univariate Sampling of BRDFs},
author = {Zhuo Hui and Kalyan Sunkavalli and Joon-Young Lee and Sunil Hadap and Jian Wang and Aswin C. Sankaranarayanan},
booktitle = {ICCV 2017},
year = {2017}
}