Test-Time Adaptation with Binary Feedback
Taeckyung Lee, Sorn Chottananurak, Junsu Kim, Jinwoo Shin, Taesik Gong, Sung-Ju Lee
Abstract
Deep learning models perform poorly when domain shifts exist between training and test data. Test-time adaptation (TTA) is a paradigm to mitigate this issue by adapting pre-trained models using only unlabeled test samples. However, existing TTA methods can fail under severe domain shifts, while recent active TTA approaches requiring full-class labels are impractical due to high labeling costs. To address this issue, we introduce a new setting of TTA with binary feedback, which uses a few binary feedbacks from annotators to indicate whether model predictions are correct, thereby significantly reducing the labeling burden of annotators. Under the setting, we propose BiTTA, a novel dual-path optimization framework that leverages reinforcement learning to balance binary feedback-guided adaptation on uncertain samples with agreement-based self-adaptation on confident predictions. Experiments show BiTTA achieves substantial accuracy improvements over state-of-the-art baselines, demonstrating its effectiveness in handling severe distribution shifts with minimal labeling effort.
BibTeX
@inproceedings{
lee2025testtime,
title={Test-Time Adaptation with Binary Feedback},
author={Taeckyung Lee and Sorn Chottananurak and Junsu Kim and Jinwoo Shin and Taesik Gong and Sung-Ju Lee},
booktitle={Forty-second International Conference on Machine Learning},
year={2025},
url={https://openreview.net/forum?id=A5l37HL8vX}
}