Binary Classification from Positive-Confidence Data
Takashi Ishida, Gang Niu, Masashi Sugiyama
Abstract
Can we learn a binary classifier from only positive data, without any negative data or unlabeled data? We show that if one can equip positive data with confidence (positive-confidence), one can successfully learn a binary classifier, which we name positive-confidence (Pconf) classification. Our work is related to one-class classification which is aimed at "describing" the positive class by clustering-related methods, but one-class classification does not have the ability to tune hyper-parameters and their aim is not on "discriminating" positive and negative classes. For the Pconf classification problem, we provide a simple empirical risk minimization framework that is model-independent and optimization-independent. We theoretically establish the consistency and an estimation error bound, and demonstrate the usefulness of the proposed method for training deep neural networks through experiments.
BibTeX
@inproceedings{NEURIPS2018_bd135462,
author = {Ishida, Takashi and Niu, Gang and Sugiyama, Masashi},
booktitle = {Advances in Neural Information Processing Systems},
editor = {S. Bengio and H. Wallach and H. Larochelle and K. Grauman and N. Cesa-Bianchi and R. Garnett},
pages = {},
publisher = {Curran Associates, Inc.},
title = {Binary Classification from Positive-Confidence Data},
url = {https://proceedings.neurips.cc/paper_files/paper/2018/file/bd1354624fbae3b2149878941c60df99-Paper.pdf},
volume = {31},
year = {2018}
}