Two Generator Game: Learning to Sample via Linear Goodness-of-Fit Test
Lizhong Ding, Mengyang Yu, Li Liu, Fan Zhu, Yong Liu, Yu Li, Ling Shao
Abstract
Learning the probability distribution of high-dimensional data is a challenging problem. To solve this problem, we formulate a deep energy adversarial network (DEAN), which casts the energy model learned from real data into an optimization of a goodness-of-fit (GOF) test statistic. DEAN can be interpreted as a GOF game between two generative networks, where one explicit generative network learns an energy-based distribution that fits the real data, and the other implicit generative network is trained by minimizing a GOF test statistic between the energy-based distribution and the generated data, such that the underlying distribution of the generated data is close to the energy-based distribution. We design a two-level alternative optimization procedure to train the explicit and implicit generative networks, such that the hyper-parameters can also be automatically learned. Experimental results show that DEAN achieves high quality generations compared to the state-of-the-art approaches.
BibTeX
@inproceedings{NEURIPS2019_b075703b,
author = {Ding, Lizhong and Yu, Mengyang and Liu, Li and Zhu, Fan and Liu, Yong and Li, Yu and Shao, Ling},
booktitle = {Advances in Neural Information Processing Systems},
editor = {H. Wallach and H. Larochelle and A. Beygelzimer and F. d\textquotesingle Alch\'{e}-Buc and E. Fox and R. Garnett},
pages = {},
publisher = {Curran Associates, Inc.},
title = {Two Generator Game: Learning to Sample via Linear Goodness-of-Fit Test},
url = {https://proceedings.neurips.cc/paper_files/paper/2019/file/b075703bbe07a50ddcccfaac424bb6d9-Paper.pdf},
volume = {32},
year = {2019}
}