UAI 2020poster6 citations

Automated Dependence Plots

David Inouye, Liu Leqi, Joon Sik Kim, Bryon Aragam, Pradeep Ravikumar

Abstract

In practical applications of machine learning, it is necessary to look beyond standard metrics such as test accuracy in order to validate various qualitative properties of a model. Partial dependence plots (PDP), including instance-specific PDPs (i.e., ICE plots), have been widely used as a visual tool to understand or validate a model. Yet, current PDPs suffer from two main drawbacks: (1) a user must manually sort or select interesting plots, and (2) PDPs are usually limited to plots along a single feature. To address these drawbacks, we formalize a method for automating the selection of interesting PDPs and extend PDPs beyond showing single features to show the model response along arbitrary directions, for example in raw feature space or a latent space arising from some generative model. We demonstrate the usefulness of our automated dependence plots (ADP) across multiple use-cases and datasets including model selection, bias detection, understanding out-of-sample behavior, and exploring the latent space of a generative model. The code is available at

BibTeX
@InProceedings{pmlr-v124-inouye20a,
  title = 	 {Automated Dependence Plots},
  author =       {Inouye, David and Leqi, Liu and Sik Kim, Joon and Aragam, Bryon and Ravikumar, Pradeep},
  booktitle = 	 {Proceedings of the 36th Conference on Uncertainty in Artificial Intelligence (UAI)},
  pages = 	 {1238--1247},
  year = 	 {2020},
  editor = 	 {Peters, Jonas and Sontag, David},
  volume = 	 {124},
  series = 	 {Proceedings of Machine Learning Research},
  month = 	 {03--06 Aug},
  publisher =    {PMLR},
  pdf = 	 {http://proceedings.mlr.press/v124/inouye20a/inouye20a.pdf},
  url = 	 {https://proceedings.mlr.press/v124/inouye20a.html},
  abstract = 	 {In practical applications of machine learning, it is necessary to look beyond standard metrics such as test accuracy in order to validate various qualitative properties of a model. Partial dependence plots (PDP), including instance-specific PDPs (i.e., ICE plots), have been widely used as a visual tool to understand or validate a model. Yet, current PDPs suffer from two main drawbacks: (1) a user must manually sort or select interesting plots, and (2) PDPs are usually limited to plots along a single feature. To address these drawbacks, we formalize a method for automating the selection of interesting PDPs and extend PDPs beyond showing single features to show the model response along arbitrary directions, for example in raw feature space or a latent space arising from some generative model. We demonstrate the usefulness of our automated dependence plots (ADP) across multiple use-cases and datasets including model selection, bias detection, understanding out-of-sample behavior, and exploring the latent space of a generative model. The code is available at
Automated Dependence Plots · UAI 2020