Jingtong Feng

Unsupervised Trajectory Optimization for 3D Registration in Serial Section Electron Microscopy using Neural ODEs

Series Section Electron Microscopy (ssEM) has emerged as a pivotal technology for deciphering nanoscale biological architectures. Three-dimensional (3D) registration is a critical step in ssEM, tasked with rectifying axial misalignments and nonlinear distortions introduced during serial sectioning.…