3 accepted papers
We study the optimization problem associated with fitting two-layer ReLU neural networks with respect to the squared loss, where labels are generated by a target network. Use is made of the rich symmetry structure to develop a novel set of tools for studying the mechanism by which over-parameterizat…
We study the optimization problem associated with fitting two-layer ReLU neural networks with respect to the squared loss, where labels are generated by a target network. We make use of the rich symmetry structure to develop a novel set of tools for studying families of spurious minima. In contrast…
We consider the optimization problem associated with fitting two-layers ReLU networks with respect to the squared loss, where labels are generated by a target network. We leverage the rich symmetry structure to analytically characterize the Hessian at various families of spurious minima in the natur…