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Yaping Yan

5 accepted papers

2025

Exploring the Relationship Between Samples and Masks for Robust Defect Localization

AAAI 2025technical

Defect detection aims to detect and localize regions out of the normal distribution. The previous approaches often explicitly incorporate the defect detection concept, such as by utilizing self-supervised ground truth or manually defined feature comparison. The aforementioned processes involve model…

Cited by 0SourcePDFScholar
2023

MSFORMER: Multi-Scale Transformer with Neighborhood Consensus for Feature Matching

ICASSP 2023accepted

Existing feature matching methods tend to extract feature descriptors by feeding down-sampled feature maps into a Transformer that is unable to extend feature scales, leading to false correspondences between small-size objects. This paper proposes MSFormer, which uses Transformers situated in differ…

Cited by 0SourceScholar
2023

ParaFormer: Parallel Attention Transformer for Efficient Feature Matching

AAAI 2023technical

Heavy computation is a bottleneck limiting deep-learning-based feature matching algorithms to be applied in many real-time applications. However, existing lightweight networks optimized for Euclidean data cannot address classical feature matching tasks, since sparse keypoint based descriptors are ex…

Cited by 18SourcePDFScholar