3 accepted papers
We present IMDD-1M, the first large-scale Industrial Multimodal Defect Dataset comprising 1,000,000 aligned image-text pairs, designed to advance multimodal learning for manufacturing and quality inspection. IMDD-1M contains high-resolution real-world defects spanning over 60 material categories and
This paper presents the Implicit Knowledge Distillation Diffusion Transformer (IKDDiT), a groundbreaking model tailored for photolithography overlay map generation in semiconductor manufacturing. IKDDiT effectively addresses the challenges of open-vocabulary overlay map generation by integrating pre…
With the rapid development of artificial intelligence and autonomous driving technology, the demand for semiconductors is projected to rise substantially. However, the massive expansion of semiconductor manufacturing and the development of new technology will bring many defect wafers. If these defec…