A Kernel Stein Test of Goodness of Fit for Sequential Models
Jerome Baum, Heishiro Kanagawa, Arthur Gretton
Abstract
We propose a goodness-of-fit measure for probability densities modeling observations with varying dimensionality, such as text documents of differing lengths or variable-length sequences. The proposed measure is an instance of the kernel Stein discrepancy (KSD), which has been used to construct goodness-of-fit tests for unnormalized densities. The KSD is defined by its Stein operator: current operators used in testing apply to fixed-dimensional spaces. As our main contribution, we extend the KSD to the variable-dimension setting by identifying appropriate Stein operators, and propose a novel KSD goodness-of-fit test. As with the previous variants, the proposed KSD does not require the density to be normalized, allowing the evaluation of a large class of models. Our test is shown to perform well in practice on discrete sequential data benchmarks.
BibTeX
@inproceedings{icml2023_akernelsteintest,
title = {A Kernel Stein Test of Goodness of Fit for Sequential Models},
author = {Jerome Baum and Heishiro Kanagawa and Arthur Gretton},
booktitle = {ICML 2023},
year = {2023}
}