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Ruiguo Yang

2 accepted papers

2020

Task Space Motion Control for AFM-Based Nanorobot Using Optimal and Ultralimit Archimedean Spiral Local Scan

RA-L 2020

Atomic force microscopy (AFM) based nanorobotic technology provides a unique manner for delicate operations at the nanoscale in various ambient, thanks to its ultrahigh spatial resolution, outstanding environmental adaptability, and numerous measurement approaches. However, one vital challenge behin

Cited by 9SourceScholar
2015

Compensating asymmetric hysteresis for nanorobot motion control

ICRA 2015poster

Atomic force microscopy (AFM) is a powerful measurement instrument, which has been widely implemented in various fields. To enhance the maneuverability, an AFM can be modified and its cantilever can be controlled as a robotic end-effector. To precisely control the nanorobots, their scanners inherent…

Cited by 25SourceScholar