Weibin Rong — accepted AI-conference papers

2021

Model Predictive Control With Obstacle Avoidance for Inertia Actuated AFM Probes Inside a Scanning Electron Microscope

Shuai Liang, Mokrane Boudaoud, Pascal Morin, Jonathan Cailliez, Barthelemy Cagneau, Weibin Rong +1

RA-L 2021

The Atomic Force Microscope (AFM) is a reliable tool for 3D imaging and manipulation at the micrometer and nanometer scales. When used inside a Scanning Electron Microscope (SEM), AFM probes can be localized and controlled with a nanometer resolution by visual feedback. However, achieving trajectory

Cited by 5 Source ↗Scholar ↗

2019

Atomic force microscope tip localization and tracking through deep learning based vision inside an electron microscope

Shuai Liang, Mokrane Boudaoud, Catherine Achard, Weibin Rong, Stéphane Régnier

IROS 2019poster

Scanning Electron Microscopy (SEM) is an ideal observation tool for small scales robotics. It has the potential to achieve automated nano-robotic tasks such as nano-handling and nano-assembly. Path following control of nano-robot end effectors using SEM vision feedback is a key for an intuitive prog…

Cited by 4 Source ↗Scholar ↗