Khaled Aljanaideh — accepted AI-conference papers

2025

Data-Driven Fault Detection for Wafer Scanner Cable Slabs using Koopman Operators

Michael Pumphrey, Mohammad Al Saaideh, Yazan Mohammad Al-Rawashdeh, Natheer Alatawneh, Khaled Aljanaideh, Almuatazbellah M. Boker +1

IROS 2025

The reliability of precision motion systems, such as semiconductor wafer scanners, is often influenced by nonlinear dynamics originating from components such as cable slabs. This paper introduces a data-driven framework for early fault diagnosis in these systems. Koopman operator theory is employed

Cited by 0 Source ↗Scholar ↗

2024

Position Control of a Low-Energy C-Core Reluctance Actuator in a Motion System

Mohammad Al Saaideh, Yazan M. Al-Rawashdeh, Natheer Alatawneh, Khaled Aljanaideh, Mohammad Al Janaideh

IROS 2024poster

This paper introduces a position control system for a motion stage driven by a low-energy C-core reluctance actuator. The central concept explored here is the utilization of a variable air gap to enable energy-efficient operation of the motion stage. First, we show the design and mathematical model…

Cited by 0 Source ↗Scholar ↗

2023

Design and Control of a Reluctance-Based Micropositioning Stage for Scanning Motion Applications

Mohammad Al Saaideh, Natheer Alatawneh, Khaled Aljanaideh, Mohammad Al Janaideh

IROS 2023poster

This paper presents a design and characterization of a micropositioning stage driven by a reluctance actuator. The stage is constructed with a C-core reluctance actuator and four compression springs. The design of the stage is presented using a CAD model, followed by the fabrication process of the p…

Cited by 2 Source ↗Scholar ↗