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Yazan M. Al-Rawashdeh

8 accepted papers

2024

Data-Driven Modeling of Cable Slab Dynamics via Neural Networks

IROS 2024poster

A novel method for analyzing the dynamics and bend geometry of a cable slab via trained neural networks is introduced. Neural networks are trained from real-time visual feedback capture via a high-speed camera during cyclic motion to track the positions of multiple markers affixed to the cable slab…

Cited by 1SourceScholar
2024

Model-Free Control of a Class of High-Precision Scanning Motion Systems with Piezoceramic Actuators

ICRA 2024poster

To enhance the precision of coarse long-stroke motion axes, complementary short-stroke fine positioning stages are usually introduced. Being mechanically attached, the motion of the combined positioning stages needs to be controlled and synchronized. Therefore, typically suitable model-based control…

Cited by 0SourceScholar
2024

Position Control of a Low-Energy C-Core Reluctance Actuator in a Motion System

IROS 2024poster

This paper introduces a position control system for a motion stage driven by a low-energy C-core reluctance actuator. The central concept explored here is the utilization of a variable air gap to enable energy-efficient operation of the motion stage. First, we show the design and mathematical model…

Cited by 0SourceScholar
2023

Statistical Characterization of Position-Dependent Behavior Using Frequency-Aware B-Spline

IROS 2023poster

Stretching the definition of the standard Sine profile allows building a generalized symmetric frequency-aware basis function that can be used to generate reference motion trajectories. Other profiles such as polynomials, sigmoid, and harmonic-based models can be equally used under the proposed tech…

Cited by 2SourceScholar
2023

Using Piezoceramic-Actuated Stages in Precision Long-Stroke Motion Systems: A Design Procedure

IROS 2023poster

Mainly, the integration of fine positioning piezo-actuated stages in precision motion systems is considered, which results in multi-stage configurations. Mostly, in such configurations, the fine stages are attached to the coarse positioning stages- that do not meet required precision- by mechanical…

Cited by 2SourceScholar
2021

On Step-and-Scan Trajectories used in Wafer Scanners in Semiconductor Manufacturing

IROS 2021poster

Adopting the ideal reliable machine model, the throughput of a lithography machine can be given as the reciprocal of the operation time. This time can be defined at the die level where the actual exposure process takes place as the time unit per die. A closer look at the motion profiles, namely step…

Cited by 19SourceScholar