Ren-Xiang Xiao — accepted AI-conference papers

2017

A Scheme of High-Dimensional Key-Variable Search Algorithms for Yield Improvement

Fan-Tien Cheng, Yao-Sheng Hsieh, Jing-Wen Zheng, Szu-Min Chen, Ren-Xiang Xiao, Chin-Yi Lin

RA-L 2017

Product yield directly affects production cost. Thus manufacturers seek to quickly enhance product yield during the development and mass-production processes. In other words, when a yield loss occurs, the root causes should be found rapidly in both the development and mass-production phases. When a

Cited by 17 Source ↗Scholar ↗

2017

Blind-Stage Search Algorithm for the Key-Variable Search Scheme

Fan-Tien Cheng, Chin-Yi Lin, Chun-Fang Chen, Ren-Xiang Xiao, Jing-Wen Zheng, Yao-Sheng Hsieh

RA-L 2017

Yield enhancement is crucial for the companies' profitability performance, especially during the development and mass production phases. So, the root causes of yield loss should be quickly identified in these stages for saving the production cost. To identify the root causes, traditional yield enhan

Cited by 3 Source ↗Scholar ↗