23 accepted papers
Virtual Metrology (VM) technology can convert offline sampling inspection into online and real-time total inspection. As the processes of high-tech industries (semiconductor or TFT-LCD) are getting more sophisticated, higher VM prediction accuracy is demanded. With regard to this requirement, the ad
Due to the short life cycles of electronic products, trial run lots of new products are crucial in IC packaging for production verification and engineering adjustments. The processing time of trial run lots may differ significantly from production lots due to engineering adjustments and is difficult
Root-cause Analysis (RCA) of alarms is a well-established research area in automated Production Systems (aPS). Many RCA algorithms have been proposed and successfully evaluated and new ones are being developed. Recently, researchers focus on the incorporation of formalized information about the tech
Chip-probing is the key process for IC manufacturing to its ensure quality. As the number of tests increases, the test quality and the test yield will be affected because the needles on the probe card of the tester will be contaminated by external objects or worn out. Whether a needle polish of the
To ensure stable processing and high-yield production, high-tech factories (e.g., semiconductor, TFT-LCD) demand product quality total inspection. Generally speaking, sampling inspection only measures a few samples and comes with metrology delay, thus it usually cannot achieve the goal of real-time
To ensure stable manufacturing and high yield of production, factories (e.g., semiconductor or TFT-LCD fabs) conduct quality inspection on workpieces. They tend to adopt sampling inspection in consideration of reducing cost and cycle time, yet that fails to achieve real-time and online total inspect
Determining thresholds of the primary control loops (System 1) of an additive manufacturing (AM) process is challenging when realizing System 1 with its fast and intuitive capability for adapting to different metal powers, machine configurations, and process parameters. Based on the convolution neur
Wheel balance plays an important role in vehicle safety. The existing inspection method for wheel balance mainly relies on the off-machine measurement technique, which is time- and manpower-consuming as the worldwide requirement of the automated production system gradually increases. However, the mu
For the current wafer sawing process, the wafers in the same lot are inspected at the end of the entire process. Therefore, a defect, such as chipping, occurs during processing will only be detected until the end of the process, which is too late and may cause massive defects. If Automatic Virtual M
Maintaining tool availability is the key to ensure machining quality. To evaluate tool availability so as to improve its utilization, the tool diagnosis models for tool-remaining-useful-life (RUL) estimation and tool-state classification are required. These models need sufficient samples to cover al
Electrical discharge machining (EDM) can machine hard conductive workpieces that are difficult to machine using traditional machining techniques. For monitoring the EDM process using virtual metrology (VM), probes with a very high sampling rate are needed to acquire the voltage and current signals o
The capability of measuring melt pool variation is the key evaluating metal additive manufacturing quality. To measure the variation, a metrology architecture with <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">in situ</i> melt pool measurement and
Carbon fiber is currently one of the most popular composite materials in the world, with its wide applications ranging from bikes to space shuttles. However, there is no comprehensive method for the total quality inspection of carbon fiber products so far due to its feature of continuous production
Predictive maintenance aims to find out when the target device (TD) is in the sick state and almost entering the dead state before its actual occurrence to conduct just-in-time maintenance, so as to avoid unexpected TD down time. In this way, not only tool availability and manufacturing quality are
Cloud manufacturing (CMfg) has emerged as a next-generation manufacturing paradigm that has potential to revolutionize the manufacturing industry. In further promotion of CMfg, how to build CMfg services in an automatic and efficient manner is an essential and challenging subject. Currently, there i
Industry 4.0 paves the way to smart factory through integrating Internet of Things, cyber-physical systems, cloud manufacturing, and big data analytics for various industrial fields. Especially, the machinery industry significantly benefits from these automation techniques in machine-tool quality in
With the trend of even smaller workpieces and complicated processes in the semiconductor industry, yield enhancement becomes the crucial indicator of enterprise profits. However, the advancement of the manufacturing processes results in huge-and-complicated data, it becomes difficult to quickly sear
Product yield directly affects production cost. Thus manufacturers seek to quickly enhance product yield during the development and mass-production processes. In other words, when a yield loss occurs, the root causes should be found rapidly in both the development and mass-production phases. When a
One of the core values of Industry 4.0 targets to integrate people's demand into manufacturing for enhanced products, systems, and services for a wider variety of increasingly personalized customization of products. Thus, Industry 4.0 advances the traditional manufacturing techniques from mass produ
Yield enhancement is crucial for the companies' profitability performance, especially during the development and mass production phases. So, the root causes of yield loss should be quickly identified in these stages for saving the production cost. To identify the root causes, traditional yield enhan
As semiconductor manufacturing processes are becoming more and more sophisticated, how to maintain their feasible production yield becomes an important issue. Also, how to build a smart manufacturing platform that can facilitate realizing smart factories is essential and desirable for current manufa
Industry 4.0 is set to be one of the new manufacturing objectives. The technologies involved to achieve Industry 4.0 are Internet of Things (IoT), cyber physical systems (CPS), and cloud manufacturing (CM). However, the current objectives defined by Industry 4.0 do not include zero defects; it only
Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM ac…