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Yao-Sheng Hsieh

4 accepted papers

2017

A Scheme of High-Dimensional Key-Variable Search Algorithms for Yield Improvement

RA-L 2017

Product yield directly affects production cost. Thus manufacturers seek to quickly enhance product yield during the development and mass-production processes. In other words, when a yield loss occurs, the root causes should be found rapidly in both the development and mass-production phases. When a

Cited by 17SourceScholar
2017

Blind-Stage Search Algorithm for the Key-Variable Search Scheme

RA-L 2017

Yield enhancement is crucial for the companies' profitability performance, especially during the development and mass production phases. So, the root causes of yield loss should be quickly identified in these stages for saving the production cost. To identify the root causes, traditional yield enhan

Cited by 3SourceScholar
2017

Development of Advanced Manufacturing Cloud of Things (AMCoT) - A Smart Manufacturing Platform

RA-L 2017

As semiconductor manufacturing processes are becoming more and more sophisticated, how to maintain their feasible production yield becomes an important issue. Also, how to build a smart manufacturing platform that can facilitate realizing smart factories is essential and desirable for current manufa

Cited by 75SourceScholar
2015

Dynamic ISD scheme for the AVM system - a preliminary study

ICRA 2015poster

Reducing the sampling rate to as low as possible is a high priority for many factories to reduce production cost. Automatic-Virtual-Metrology (AVM) based Original Intelligent Sampling Decision (Original ISD) scheme had been previously developed for reducing the sampling rate and sustaining the VM ac…

Cited by 3SourceScholar